Assembly and Packaging White Papers

Stay up to date with the latest Assembly and Packaging white papers from the global semiconductor industry

Latest White Papers

See-Through Sillicon Inspection Application Studies Based on Tradtional Silicon Imager Rudolph Technologies With semiconductor development processes hitting harder and harder on Moore's law to continuously scale down, high-density advanced packaging technologies become a promising alternate route...

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Optimisation Solvers in Run-to-Run Control Rudolph Technologies Semiconductor manufacturing processes with multiple settings or multiple targets, such as furnace applications or processes controlling uniformity, may not have a single algebraic solution,...

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GST Cell Array Characterisation Using Picosecond Ultrasonics Rudolph Technologies Phase change random access memory alloys (PRAM or PCM) are a class of non-volatile memory that is thought as viable alternatives to flash memory technologies depending on the end applications...

Sensitivity and Performance Estimates for the Multiple Wavelength, Multiple Incidence Angle Ellipsometry for OCD Applications Rudolph Technologies New complex transistors architectures expand application space of the scatterometry beyond measurements of the simple photoresist and a-Si gratings towards characterisation of more complex...