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Test and Measurement - Page 1

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Latest Test and Measurement Update

Silicon Temperature Sensors 01 March, 2005 Today's designs require more in-depth analysis of the thermal budget and closed-loop temperature control is fast becoming an important feature of electronic systems. Failing to take these... > read more

Machine Learning in Manufacturing 01 September, 2004 There is money to be saved from the use of even the simplest machine learning routines. Gary R Bradski of Intel Research assesses the leading algorithms and how they might be used to...

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