<p>Metrology plays a crucial role in manufacturing. However, given its high capital equipment cost and cycle
time impact on critical processes, metrology is a high-cost, high-stakes proposition. Further, issues with
performance of metrology systems can lead to additional manufacturing cost and waste. These issues
include lack of ability to support wafer-to-wafer metrology, delays in metrology data feedback, and lost productivity from non-optimal process control and lack of optimised metrology strategies.</p>
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